Details
ISBN/EAN: 978-3-527-41365-2
Einband: kartoniertes Buch
Weitere Details
Auflage:
2. Auflage 2018
2. Auflage 2018
Erschienen am:
24.01.2018
24.01.2018
Sprache:
English
English
Umfang:
516 S., 336 s/w Illustr., 4 s/w Tab., 340 Illustr.
516 S., 336 s/w Illustr., 4 s/w Tab., 340 Illustr.
Format (T/L/B):
2.6 x 24.5 x 17.3 cm
2.6 x 24.5 x 17.3 cm
Weitere Details
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Machine Vision Algorithms and Applications
79,90 €
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Beschreibung
The second edition of this successful machine vision textbook is completely updated, revised and expanded by 35% to reflect the developments of recent years in the fields of image acquisition, machine vision algorithms and applications. The new content includes, but is not limited to, a discussion of new camera and image acquisition interfaces, 3D sensors and technologies, 3D reconstruction, 3D object recognition and state-of-the-art classification algorithms. The authors retain their balanced approach with sufficient coverage of the theory and a strong focus on applications. All examples are based on the latest version of the machine vision software HALCON 13.
Über Carsten Steger, Markus Ulrich, Christian Wiedemann
Carsten Steger studied computer science at the Technical University of Munich (TUM) and received his PhD degree from TUM in 1998. In 1996, he co-founded the company MVTec, where he heads the Research department. He has authored and co-authored more than 80 scientific publications in the field of computer and machine vision. In 2011, he was appointed a TUM honorary professor for the field of computer vision. Markus Ulrich studied Geodesy and Remote Sensing at the Technical University of Munich (TUM) and received his PhD degree from TUM in 2003. In 2003, he joined MVTec?s Research and Development department as a software engineer and became head of the research team in 2008. He has authored and co-authored scientific publications in the fields of photogrammetry and machine vision. Markus Ulrich is also a guest lecturer at TUM, where he teaches close-range photogrammetry. In 2017, he was appointed a Privatdozent (lecturer) at the Karlsruhe Institute of Technology (KIT) for the field of machine vision. Christian Wiedemann studied Geodesy and Remote Sensing at the Technical University of Munich (TUM) and received his PhD degree from TUM in 2001. He has authored and co-authored more than 40 scientific publications in the fields of photogrammetry, remote sensing, and machine vision. In 2003, he joined MVTec's Research and Development department as a software engineer. Since 2008, he has held different leading positions at MVTec.